| 1 |
2026 |
MDPI/Electronics |
Journal |
UPSET: A Comprehensive Probabilistic Single Event Transient Analysis Flow for VLSI Circuits Using Static Timing Analysis |
Christos Georgakidis, Dimitris Valiantzas, Nikolaos Chatzivangelis, Marko Andjelkovic, Christos Sotiriou, Milos Krstic |
https://www.mdpi.com/2079-9292/15/4/818, https://zenodo.org/records/18705054 |
| 2 |
2026 |
MDPI/Electronics |
Journal |
Efficient Reliability-Aware Hardware Trojan Design and Insertion for SET-Induced Soft Error Attacks |
Alexandra Takou, Georgios-Ioannis Paliaroutis, Pelopidas Tsoumanis, Marko Andjelkovic, Fabian Vargas, Nestor Evmorfopoulos, George Stamoulis |
https://www.mdpi.com/2079-9292/15/2/425, https://zenodo.org/records/18704352 |
| 3 |
2026 |
2026 IEEE European Test Symposium (ETS) |
Conference |
Machine Learning Approach for Cross-Technology Prediction of the Generated Single Event Transient |
Konstantinos Varakliotis, Nikolaos Zazatis, Marko Andjelkovic, Nikolaos Chatzivangelis, Fabian Vargas, Milos Krstic, Christos Sotiriou |
https://ieeexplore.ieee.org/document/11591722/, https://zenodo.org/records/20374379 |
| 4 |
2026 |
2026 IEEE European Test Symposium (ETS) |
Conference |
STA-Based Single Event Transient Propagation in Advanced Technology Nodes |
Nikolaos Chatzivangelis, Marios Karagiannis, Christos Georgakidis, Nikolaos Sketopoulos, Marko Andjelkovic, Luigi Dilillo, Christos Sotiriou |
https://ieeexplore.ieee.org/document/11591546, https://zenodo.org/records/20511417 |
| 5 |
2026 |
2026 IEEE 44th VLSI Test Symposium (VTS) |
Conference |
Soft Error Reliability Analysis & Hardening of NVDLA MAC Units |
Nikolaos Chatzivangelis, Nikolaos Betsos, Georgios-Ioannis Paliaroutis, Nikolaos Zazatis, Pelopidas Tsoumanis, Frederic Wrobel, Marko Andjelkovic, Chr |
https://ieeexplore.ieee.org/document/11563393, https://zenodo.org/records/21279641 |
| 6 |
2026 |
2026 IEEE 44th VLSI Test Symposium (VTS) |
Conference |
Cross-Layer Reliability Analysis of Slimmable Neural Networks under Permanent Faults |
Nikolaos Zazatis, Alessandro Veronesi, Konstantinos Varakliotis, Pelopidas Tsoumanis, Christos Sotiriou, Leticia Maria Bolzani Pöhls, Marko Andjelkovi |
https://ieeexplore.ieee.org/document/11563389, https://zenodo.org/records/21279206 |
| 7 |
2026 |
2026 IEEE 27th Latin American Test Symposium (LATS) |
Conference |
Resilience Analysis of a Fault-Tolerant MPSoC Interconnection Architecture Under SEU Fault Injection |
Thiago H. Rausch, Wesley Grignani, Luigi Dilillo, Douglas R. Melo |
https://ieeexplore.ieee.org/document/11480296, https://zenodo.org/records/18705429 |
| 8 |
2026 |
2026 IEEE 27th Latin American Test Symposium (LATS) |
Conference |
Design and Reliability Analysis of a Pipeline RISC-V Processor Core |
Douglas A. Santos, Wesley Grignani, Carolina Imianosky, Douglas R. Melo, Luigi Dilillo |
https://ieeexplore.ieee.org/document/11480308, https://zenodo.org/records/18703492 |
| 9 |
2026 |
2026 IEEE 27th Latin American Test Symposium (LATS) |
Conference |
Characterization of a Fault-Tolerant RISC-V SoC in an SRAM-based FPGA Under Proton Irradiation |
Wesley Grignani, Douglas A. Santos, Carolina Imianosky, Douglas R. Melo, Frédéric Wrobel, Luigi Dilillo |
https://ieeexplore.ieee.org/document/11480385, https://zenodo.org/records/18705411 |
| 10 |
2026 |
2026 30th International Symposium on Asynchronous Circuits and Systems (ASYNC) |
Conference |
A Test Architecture for Bundled-Data Asynchronous NoC Switches Using Commercial ATPG Tools |
Iordana Gaisidou, Giuseppe Chessa, Giannis Giannoulas, Artur Jutman, Davide Bertozzi, Christos Sotiriou |
https://ieeexplore.ieee.org/document/11594482, https://zenodo.org/records/22686354 |
| 11 |
2026 |
Microprocessors and Microsystems |
Journal |
Temperature-aware compact SER modeling using model order reduction |
Pavlos Stoikos, Olympia Axelou, Pelopidas Tsoumanis, Georgios-Ioannis Paliaroutis, Luigi Dilillo, Anuj Pathania, George Floros |
https://doi.org/10.1016/j.micpro.2026.105277 |
| 12 |
2026 |
Microprocessors and Microsystems |
Journal |
Reliability analysis of clock networks and critical paths under radiation-induced transients using custom simulation tools |
Nikolaos Chatzivangelis, Georgios-Ioannis Paliaroutis, Wesley Grignani, Christos Sotiriou, Frederic Wrobel, Luigi Dilillo |
https://doi.org/10.1016/j.micpro.2026.105330 |
| 13 |
2025 |
Design, Automation & Test in Europe Conference (DATE 2025) |
Conference |
Multi-Partner Project: Twinning for Excellence in Reliable Electronics (TWIN-RELECT) |
Marko Andjelkovic, Fabian Vargas, Milos Krstic, Luigi Dilillo, Alain Michez, Frederic Wrobel, Davide Bertozzi, Mikel Lujan, Christos Georgakidis, Niko |
https://ieeexplore.ieee.org/document/10992721, https://zenodo.org/records/17650944 |
| 14 |
2025 |
Synthesis, Modeling, Analysis and Simulation Methods, and Applications to Circuit Designs (SMACD) |
Conference |
Prediction of Single Event Transient Propagation Using Machine Learning Models |
Marko Andjelkovic, Junchao Chen, Jelisaveta Aleksic, Vishnu Padmakumar, Milos Marjanovic, Nikolaos Zazatis, Trupti Ranjan Lenka, Danijel Dankovic, Chr |
https://ieeexplore.ieee.org/abstract/document/11092057, https://zenodo.org/records/18696248 |
| 15 |
2025 |
Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) |
Conference |
Special Session Paper: Simulation Methodologies and Experiments for Reliability Analysis of Devices in Radiation Harsh Environments |
Nikolaos Chatzivangelis, Nikolaos Zazatis, Wesley Grignani, Georgios-Ioannis Paliaroutis, Douglas A Santos |
https://hal.science/hal-05371489v1, https://zenodo.org/records/18701232 |
| 16 |
2025 |
Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) |
Conference |
Compact SER Models for Line-Source-Induced Charge Collection Using Model Order Reduction |
Pavlos Stoikos, Olympia Axelou, Pelopidas Tsoumanis, Georgios-Ioannis Paliaroutis, Luigi Dilillo, Anuj Pathania, George Floros |
https://ieeexplore.ieee.org/document/11257486, https://zenodo.org/records/17775641 |
| 17 |
2025 |
Synthesis, Modeling, Analysis and Simulation Methods, and Applications to Circuits Design (SMACD) |
Conference |
Fault Injection Attacks Based on Layout-Driven SER Analysis |
Alexandra Takou, Pelopidas Tsoumanis, Georgios-Ioannis Paliaroutis, Nestor Evmorfopoulos, George Stamoulis |
https://ieeexplore.ieee.org/document/11092174/, https://zenodo.org/records/17881842 |
| 18 |
2025 |
Synthesis, Modeling, Analysis and Simulation Methods, and Applications to Circuits Design (SMACD) |
Conference |
Compact SER Models via Model Order Reduction of Diffusion-Based Charge Collection |
Pavlos Stoikos, Olympia Axelou, Pelopidas Tsoumanis, Georgios-Ioannis Paliaroutis, Luigi Dilillo, Anuj Pathania, George Floros |
https://www.techrxiv.org/doi/full/10.36227/techrxiv.175423904.48530220, https://zenodo.org/records/17881681 |
| 19 |
2025 |
International Workshop on Advances in Sensors and Interfaces (IWASI) |
Conference |
Efficient TinyML Inference on a Fault-Tolerant RISC-V SoC with Vector Extension |
Carolina Imianosky, Douglas A. Santos, Luigi Dilillo |
https://ieeexplore.ieee.org/document/11121981, https://zenodo.org/records/18703303 |
| 20 |
2025 |
29th IEEE International Symposium on Asynchronous Circuits and Systems (ASYNC) |
Conference |
Post-Placement Timing Optimisations on Asynchronous Designs |
Dimitrios Tsalapatas, Nikolaos Chatzivangelis, Christos Sotiriou, Nikolaos Sketopoulos |
https://ieeexplore.ieee.org/abstract/document/11021016, https://zenodo.org/records/17901839 |
| 21 |
2025 |
29th IEEE International Symposium on Asynchronous Circuits and Systems (ASYNC) |
Conference |
A Synthesis Toolflow for the Predictable Implementation of High-Performance Bundled-Data Asynchronous NoCs on FPGA |
Giuseppe Chessa, Elena Bellodi, Michele Favalli, Davide Zoni, Davide Bertozzi |
https://ieeexplore.ieee.org/document/11021102 |
| 22 |
2024 |
IEEE Journal on Emerging and Selected Topics in Circuits and Systems (JETCAS) |
Journal |
An Ultra-Low Cost and Multicast-Enabled Asynchronous NoC for Neuromorphic Edge Computing |
Zhe Su, Simone Ramini, Demetra Coffen Marcolin, Alessandro Veronesi, Milos Krstic, Giacomo Indiveri, Davide Bertozzi, Steven M. Nowick |
https://doi.org/10.1109/JETCAS.2024.3433427 |