Publications

# Year Acronym Publication Title Authors URL link(s)
1 2026 MDPI/Electronics Journal UPSET: A Comprehensive Probabilistic Single Event Transient Analysis Flow for VLSI Circuits Using Static Timing Analysis Christos Georgakidis, Dimitris Valiantzas, Nikolaos Chatzivangelis, Marko Andjelkovic, Christos Sotiriou, Milos Krstic https://www.mdpi.com/2079-9292/15/4/818, https://zenodo.org/records/18705054
2 2026 MDPI/Electronics Journal Efficient Reliability-Aware Hardware Trojan Design and Insertion for SET-Induced Soft Error Attacks Alexandra Takou, Georgios-Ioannis Paliaroutis, Pelopidas Tsoumanis, Marko Andjelkovic, Fabian Vargas, Nestor Evmorfopoulos, George Stamoulis https://www.mdpi.com/2079-9292/15/2/425, https://zenodo.org/records/18704352
3 2025 Design, Automation & Test in Europe Conference (DATE 2025) Conference Multi-Partner Project: Twinning for Excellence in Reliable Electronics (TWIN-RELECT) Marko Andjelkovic, Fabian Vargas, Milos Krstic, Luigi Dilillo, Alain Michez, Frederic Wrobel, Davide Bertozzi, Mikel Lujan, Christos Georgakidis, Niko https://ieeexplore.ieee.org/document/10992721, https://zenodo.org/records/17650944
4 2025 Synthesis, Modeling, Analysis and Simulation Methods, and Applications to Circuit Designs (SMACD) Conference Prediction of Single Event Transient Propagation Using Machine Learning Models Marko Andjelkovic, Junchao Chen, Jelisaveta Aleksic, Vishnu Padmakumar, Milos Marjanovic, Nikolaos Zazatis, Trupti Ranjan Lenka, Danijel Dankovic, Chr https://ieeexplore.ieee.org/abstract/document/11092057, https://zenodo.org/records/18696248
5 2025 Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) Conference Special Session Paper: Simulation Methodologies and Experiments for Reliability Analysis of Devices in Radiation Harsh Environments Nikolaos Chatzivangelis, Nikolaos Zazatis, Wesley Grignani, Georgios-Ioannis Paliaroutis, Douglas A Santos https://hal.science/hal-05371489v1, https://zenodo.org/records/18701232
6 2025 Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) Conference Compact SER Models for Line-Source-Induced Charge Collection Using Model Order Reduction Pavlos Stoikos, Olympia Axelou, Pelopidas Tsoumanis, Georgios-Ioannis Paliaroutis, Luigi Dilillo, Anuj Pathania, George Floros https://ieeexplore.ieee.org/document/11257486, https://zenodo.org/records/17775641
7 2025 Synthesis, Modeling, Analysis and Simulation Methods, and Applications to Circuits Design (SMACD) Conference Fault Injection Attacks Based on Layout-Driven SER Analysis Alexandra Takou, Pelopidas Tsoumanis, Georgios-Ioannis Paliaroutis, Nestor Evmorfopoulos, George Stamoulis https://ieeexplore.ieee.org/document/11092174/, https://zenodo.org/records/17881842
8 2025 Synthesis, Modeling, Analysis and Simulation Methods, and Applications to Circuits Design (SMACD) Conference Compact SER Models via Model Order Reduction of Diffusion-Based Charge Collection Pavlos Stoikos, Olympia Axelou, Pelopidas Tsoumanis, Georgios-Ioannis Paliaroutis, Luigi Dilillo, Anuj Pathania, George Floros https://www.techrxiv.org/doi/full/10.36227/techrxiv.175423904.48530220, https://zenodo.org/records/17881681
9 2025 International Workshop on Advances in Sensors and Interfaces (IWASI) Conference Efficient TinyML Inference on a Fault-Tolerant RISC-V SoC with Vector Extension Carolina Imianosky, Douglas A. Santos, Luigi Dilillo https://ieeexplore.ieee.org/document/11121981, https://zenodo.org/records/18703303
10 2025 29th IEEE International Symposium on Asynchronous Circuits and Systems (ASYNC) Conference Post-Placement Timing Optimisations on Asynchronous Designs Dimitrios Tsalapatas, Nikolaos Chatzivangelis, Christos Sotiriou, Nikolaos Sketopoulos https://ieeexplore.ieee.org/abstract/document/11021016, https://zenodo.org/records/17901839
11 2024 IEEE Journal on Emerging and Selected Topics in Circuits and Systems (JETCAS) Journal An Ultra-Low Cost and Multicast-Enabled Asynchronous NoC for Neuromorphic Edge Computing Zhe Su, Simone Ramini, Demetra Coffen Marcolin, Alessandro Veronesi, Milos Krstic, Giacomo Indiveri, Davide Bertozzi, Steven M. Nowick https://doi.org/10.1109/JETCAS.2024.3433427